17 Apr 2003
The Office for Protection of Competition approved an exemption from the state aid prohibition in favour of the undertaking TESCAN in the form of subsidy for entrepreneurial activity.
State aid will be granted in compliance with the conditions of Framework programme for support of technological centres establishment and enlargement approved by the Governmental Resolution in June of the last year. The Framework aims at the support of investment projects leading to an enlargement and establishment of technological centres related to high-tech products and technologies at the Czech Republic and creation of new jobs for highly qualified experts.
However, the Chairman of the Office laid down in his decision one condition. „The aid may not exceed 63% of total value of the actual invested eligible costs related to the investment project and it may not exceed the amount of CZK 15.83,“ said the Chairman, Mr. Josef Bednář.
The undertaking TESCAN, headquartered in Brno, is active in the production, installation and maintenance of electrical machines and devices, providing software and trade activities. The undertaking was engaged in the development of computer control and analysis of picture for electronic and light microscopes, modernization of electronic microscopes, tunnel microscope development, digital electronic microscope development and production. The undertaking complies with criteria laid down for small and middle-sized enterprises.
The undertaking is intending to realize in district Brno an initial investment for enlargement of production by new innovative technological activities in the field of electron microscopy aimed at development, construction and realization of prototypes and production of scanning electronic microscopes. Within the project, it will be accomplished the applied research and development related to electronic optical system with auto emission jet and electron circuits. It will be created production documentation according to which two prototypes of device will be manufactured and tested. Further it will be produced software for control of device and for processing and evaluating of acquired information. This type of microscope belongs to the top appliance with the highest achievable parameters in the field of scanning electronic microscopy.
Press and Information Department